By Topic

Thermal behavior of crystalline thin film silicon solar cells

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Balázs Plesz ; Budapest University of Technology and Economics, Department of Electron Devices, H-1117 Magyar Tudósok krt. 2, Budapest, Hungary

The goal of this paper is to investigate the thermal behavior of crystalline thin film silicon solar cells, and to determine whether the decrease in cell thickness affects the temperature dependences of the solar cell parameters. For the investigation crystalline solar cells with a photoactive layer thickness of 26, 38 and 50 microns were used. Sample cells were formed on n+-substrate wafers with n epitaxial layers where due to the low minority carrier lifetime in the substrate only the epitaxial layer participates effectively in the photocurrent generation. The thin photoactive layers were achieved by the etching of the epitaxial layer. On the samples I-V curves and spectral response functions were measured at different temperatures, and the temperature coefficients of the short circuit current, the open circuit voltage and the efficiency were determined. It was found, that the short circuit current shows higher temperature dependence in thin crystalline silicon cells, than in silicon solar cells with the usual thickness (150-200 μm). An explanation for this effect can be given based on the temperature dependence of the absorption factor of crystalline silicon. The results of the temperature dependant spectral response measurements seem to confirm this proposition.

Published in:

Thermal Investigations of ICs and Systems (THERMINIC), 2011 17th International Workshop on

Date of Conference:

27-29 Sept. 2011