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Radiation Characterization of Microsemi ProASIC3 Flash FPGA Family

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3 Author(s)
Poivey, C. ; ESA ESTEC, Noordwijk, Netherlands ; Grandjean, M. ; Guerre, F.-X.

We present radiation data, Heavy ion and proton induced Single Event Effects (SEE) and Total Ionizing Dose (TID), on the Microsemi ProASIC3 Flash Field Programmable Gate Array (FPGA) A3PE3000L. These tests have been performed in the frame of an European Space Agency (ESA) Technology Research Program (TRP).

Published in:

Radiation Effects Data Workshop (REDW), 2011 IEEE

Date of Conference:

25-29 July 2011