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Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

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10 Author(s)
Craig Hafer ; Aeroflex Colorado Springs, Colorado Springs, CO, USA ; Mike Lahey ; Debra Harris ; Jennifer Larsen
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Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.

Published in:

2011 IEEE Radiation Effects Data Workshop

Date of Conference:

25-29 July 2011