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Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

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10 Author(s)
Hafer, C. ; Aeroflex Colorado Springs, Colorado Springs, CO, USA ; Lahey, M. ; Harris, D. ; Larsen, J.
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Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.

Published in:

Radiation Effects Data Workshop (REDW), 2011 IEEE

Date of Conference:

25-29 July 2011