By Topic

A Summary of Single Event Upset Testing of CD4000 Series Devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Lombardi, R.E. ; Lockheed Martin Space Syst. Co., Newtown, PA, USA ; Bogorad, A.L. ; Likar, J.J. ; Rubin, A.S.
more authors

The results of single event upset (SEU) testing show that HCC4011, HCC4013, and HCC4066 devices are susceptible to transients only, HCC4020B is susceptible to bit upsets, and HCC4041 is immune to single event effects (SEE).

Published in:

Radiation Effects Data Workshop (REDW), 2011 IEEE

Date of Conference:

25-29 July 2011