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Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

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15 Author(s)
Cochran, D.J. ; MEI Technol., Inc., Seabrook, MD, USA ; Boutte, A.J. ; Campola, M.J. ; Carts, M.A.
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Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.

Published in:
Radiation Effects Data Workshop (REDW), 2011 IEEE

Date of Conference: 25-29 July 2011

Page(s):
1 - 10
ISSN :
2154-0519
Print ISBN:
978-1-4577-1281-4
INSPEC Accession Number:
12344729
Conference Location :
Las Vegas, NV
Digital Object Identifier :
10.1109/REDW.2010.6062498
Product Type:
Conference Publications

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