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Enhanced field emission and breakdown near the contact between metal and dielectric

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6 Author(s)
Chung, M.S. ; Dept. of Phys., Univ. of Ulsan, Ulsan, South Korea ; Cheon, J.P. ; Mayer, A. ; Weiss, B.L.
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We have investigated the enhanced field emission observed at the contact between metal and dielectric. Using a two-dimensional junction consisted of metal, vacuum and dielectric, we have found that both polarization charges and space charges in dielectric are responsible for not only the field emission enhancement but dielectric breakdown. The dielectric effect is obtained according to the configuration and the value of dielectric constant.

Published in:

Vacuum Nanoelectronics Conference (IVNC), 2011 24th International

Date of Conference:

18-22 July 2011