Referenced Items are not available for this document.
Hot carrier transport and noise get an increasing importance due to down scaling dimensions of microelectronic devices. A survey is given of the significant evolution and progress made during the last 40 years in this domain. A focus is made on diffusion noise : definition of the noise sources, experimental determination, microscopic modeling, noise in devices.
Published in:
Noise and Fluctuations (ICNF), 2011 21st International Conference on
Date of Conference: 12-16 June 2011
- Page(s):
- 1 - 8
- Print ISBN:
- 978-1-4577-0189-4
- INSPEC Accession Number:
- 12193194
- Conference Location :
- Toronto, ON
- Digital Object Identifier :
- 10.1109/ICNF.2011.5994299
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
