Cart (Loading....) | Create Account
Close category search window
 

Analysis and research of card ticket's security based on card scraping & vending technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Zhilin Wu ; Sch. of Mech. Eng., Nanjing Univ. of Sci. & Technol., Nanjing, China ; Haitao Ping ; Xiaogang Chen ; Guozhu Niu

In a new card ticket scraping and vending device of TVM (Ticket Vending Machine), the interaction between the scraper and the super-thin & non-contact IC card was analyzed by FEM (Finite Element Method) in this paper. A new improved project for ticket ejecting module of TVM was proposed to overcome the defects of traditional method of vending tickets with friction wheel, which hurts the cards easily with low control accuracy. Finite element models of the scraper-ticket collision in two types were created and the structural transient of the card was analyzed. The ticket's security was verified by analyzing the maximum stress of the ticket and the deformation at the location of the chip.

Published in:

Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on

Date of Conference:

15-17 July 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.