By Topic

Laplacian and caustic imaging theories of MEM work-function contrast

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $33
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
S. M. Kennedy ; School of Physics, Monash University, Clayton, Australia ; D. E. Jesson ; D. M. Paganin

We apply geometrical, Laplacian, and caustic imaging theories to simulate the mirror electron microscope (MEM) contrast arising from a surface phase boundary associated with a discontinuity in work function. The key approximations inherent in the theories are highlighted and investigated within strong and weak scattering regimes from the work-function test object. For strongly varying potentials, the approximation that the electron classical turning distance is unchanged fails, invalidating the quantitative accuracy of the geometrical and Laplacian approaches. For sufficiently small defocus and surface height or potential variations, the Laplacian approach facilitates an intuitive interpretation of MEM contrast.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:55 ,  Issue: 4 )