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Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM

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5 Author(s)
S. L. Christensen ; Department of Chemistry, Dalhousie University, Halifax ; B. M. Haines ; U. D. Lanke ; M. F. Paige
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The narrow energy band pass of an energy-filtered x-ray photoemission electron microscope (X-PEEM) can lead to unusual artifacts when used for spatially resolved near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and imaging of organic surfaces. Work-function differences and the rapid work-function change with radiation exposure can impair quantitative chemical analysis by NEXAFS and invert the expected image contrast. We also find that “partial-yield” detection from the narrow energy band pass of an energy-filtered X-PEEM can lead to distorted NEXAFS spectra. These observations not only are relevant for the analysis of organic surfaces by energy-filtered X-PEEM but also call into question some assumptions about quantitative NEXAFS spectroscopy.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:55 ,  Issue: 4 )