By Topic

Hybrid finite-element method??molecular dynamics approach for modelling of non-contact atomic force microscopy imaging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Pishkenari, H.N. ; Center of Excellence in Design, Robot. & Autom. (CEDRA), Sharif Univ. of Technol., Tehran, Iran ; Mahboobi, S.H. ; Meghdari, A.

Models capable of accurate simulation of the microcantilever dynamics coupled with complex tip-sample interactions are essential for interpretation of the imaging results in non-contact atomic force microscopy (AFM). In the present research, a combination of finite element and molecular dynamics methods are used for modelling the AFM system to overcome the drawbacks of conventional approaches that use a lumped system with van der Waals interaction. To illustrate the ability of the proposed scheme in providing images with atomic resolution, some simulations have been performed. In the conducted simulations, a diamond tip is interacting with nickel samples having different surface plane directions. The results demonstrate the effectiveness of the proposed modelling method for measuring the surface topography with appropriate contrast and atomic details.

Published in:

Micro & Nano Letters, IET  (Volume:6 ,  Issue: 6 )