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Shunt detection and performance characterization of silicon solar cells using thermoreflectance imaging

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6 Author(s)
Qiaoer Zhou ; Alenas Imaging, Inc., Conway, MA, USA ; Xiaolin Hu ; Al-hemyari, K. ; McCarthy, K.
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Thermoreflectance is quantitatively compared with lock-in IR thermography for NDE of solar cells. The order of magnitude enhancement in spatial resolution enables shunt detection as well as extraction of local IV curves, diode parameters, and thermal diffusivity and conductivity.

Published in:
Lasers and Electro-Optics (CLEO), 2011 Conference on

Date of Conference: 1-6 May 2011

Page(s):
1 - 2
Print ISBN:
978-1-4577-1223-4
INSPEC Accession Number:
12119332
Conference Location :
Baltimore, MD
Product Type:
Conference Publications

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