Cart (Loading....) | Create Account
Close category search window

Noninvasive method for determining the three-dimensional density distribution in an inspected object employing modulation of compton-scattered gamma signals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kondic, N. ; JUPITER Corp., Wheaton, MD, USA ; Jupiter, C.

A noninvasive measurement of the three-dimensional density distribution within an object is accomplished using a spectrometer to detect Compton-scattered photons from the inspected object that is irradiated by mono-energetic gammas from an isotopic source. This analysis describes the use of sets of virtual isogonic arcs and shells that, based on the Compton Scattering Law, represent the loci of scattering points having a common value of energy of scattered gammas-and that engulf the inspected object. A single-frequency electronic modulation on the voltage set points for each of the multi-channel analyzer energy bins allows modulation of these virtual isogonic surfaces within the inspected object to encode the scattered gamma flux from each voxel. Decoding of the detected gamma data is accomplished by multiplying it by electronic signals having frequencies identical to the voxel modulation frequencies. This is followed by integration and solution of a set of linear algebraic equations to produce an image of the density field.

Published in:

Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE

Date of Conference:

Oct. 30 2010-Nov. 6 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.