By Topic

Analytical Techniques for Materials Characterization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

This chapter contains sections titled:
Overview
X-Ray Diffraction
Raman Spectroscopy
Scanning Probe Microscopy
Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy
Confocal Microscopy
Auger Electron Spectroscopy
X-ray Photoelectron Spectroscopy
Secondary Ion Mass Spectrometry This chapter contains sections titled:
References
Exercises