Cart (Loading....) | Create Account
Close category search window
 

Direct extraction of the chirp parameter and higher order frequency chirp of ultrafast pulses via modulation-based mode-locked pulse characterization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Weiguo Yang ; Dept. of Eng. & Technol., Western Carolina Univ., Cullowhee, NC, USA

We present experimental results of direct extraction of chirp parameter made possible by temporal phase retrieval measurements of ultrafast pulses. Results for a multi-spatial-mode mode-locked semiconductor laser at various bias points are presented. The comparison with the normally used root-mean-square (r.m.s.) chirp parameter reveals that the correlation of the r.m.s. chirp parameter with the actual pulse chirp is limited, especially for complex pulse shapes that may involve non-Gaussian spectral profiles and higher order chirps. The measurement methods and results are important in studying both the semiconductor laser mode-locking dynamics and the application of such ultrafast pulses.

Published in:

Southeastcon, 2011 Proceedings of IEEE

Date of Conference:

17-20 March 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.