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Valuing reliability of unrestorable systems

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1 Author(s)
Andriy Sydor ; Lviv Polytechnic National University, 12 S.Bandery Str., 79013, UKRAINE

Main reliability parameters for unrestorable symmetric systems ramified to level 3 and with ageing output elements are examined in this paper. Models for the failure probability, the failure frequency and the failure rate are worked out in the case when the lifetime of ageing output elements is circumscribed by the Weibull distribution.

Published in:

CAD Systems in Microelectronics (CADSM), 2011 11th International Conference The Experience of Designing and Application of

Date of Conference:

23-25 Feb. 2011