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Design of layered nc-Si/Pc structures

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2 Author(s)
Pakhomov, G. ; Dept. #140, Russian Acad. of Sci., Nizhny Novgorod, Russia ; Pryakhin, D.

In this report we describe fabrication and (photo-)electrical measurements of thin-film structures consisting of sequentially deposited nanocrystalline silicon (nc-Si) and phthalocyanine semiconductor layers.

Published in:

CAD Systems in Microelectronics (CADSM), 2011 11th International Conference The Experience of Designing and Application of

Date of Conference:

23-25 Feb. 2011