Cart (Loading....) | Create Account
Close category search window
 

A simple envelope model for nonlinear power amplifiers with memory effects based on volterra expansion

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yitao Zhang ; Grad. Sch. of Sci. & Eng., Tokyo Inst. of Technol., Tokyo, Japan ; Araki, K.

For wideband communication systems, memory effects in power amplifiers (PAs) always become significant, which commonly make intermodulation-distortions (IMDs) response asymmetric in a two-tone test. The Volterra series is a general method to analyze and model the nonlinear PAs with the memory effects, while the complexity in the large number parameters to be calculated is a major limitation. In this paper, we propose a simple envelope from the Volterra series to represent the nonlinearity and the memory effects in the PAs. The proposed model reduces the parameters number remarkably and can express the asymmetric IMDs easily. The simulation results show that the proposed PA model is efficient to represent the nonlinear PA behaviors considering the memory effects.

Published in:

Microwave Conference Proceedings (APMC), 2010 Asia-Pacific

Date of Conference:

7-10 Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.