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An on-chip monitor for statistically significant circuit aging characterization

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3 Author(s)
John Keane ; Department of ECE, University of Minnesota, 200 Union Street Southeast, Minneapolis, 55455, USA ; Wei Zhang ; Chris H. Kim

We present an array-based system to accurately study variations in ROSC aging. Microsecond measurements for minimal BTI recovery, and frequency shift measurement resolution ranging down to the error floor of 0.07% are achieved with three beat frequency detection systems working in tandem. Measurement results from a 65nm test chip show that fresh frequency and Δf are uncorrelated, both the μ and σ of Δf increase with stress, and σ(Δf)/μ(Δf) decreases with stress time.

Published in:

Electron Devices Meeting (IEDM), 2010 IEEE International

Date of Conference:

6-8 Dec. 2010