Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. For technical support, please contact us at We apologize for any inconvenience.
By Topic

Measurement of continuous-time ΣΔ modulators: Implications of using spectrum analyzer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Ashry, A. ; LIP6 Lab., Univ. of Pierre & Marie Curie, Paris, France ; El-Shennawy, A.K. ; Elbadry, M. ; Elsayed, A.
more authors

In this paper, The difference between getting the output spectrum directly using spectrum analyzer and obtaining the spectrum digitally in measuring clock jitter effect on continuous-time ΣΔ modulator is analyzed. It is shown that clock jitter can be seen as input-referred or output-referred, depending on the nature of the measurement tool. Quantization noise and jitter noise are analyzed and compared graphically using a simple approach. The presented analysis is verified with system-level simulation of a 4th order bandpass continuous-time ΣΔ modulator.

Published in:

Microelectronics (ICM), 2010 International Conference on

Date of Conference:

19-22 Dec. 2010