By Topic

Face Image Modeling by Multilinear Subspace Analysis With Missing Values

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xin Geng ; School of Computer Science and Engineering, Southeast University, Nanjing, China ; Kate Smith-Miles ; Zhi-Hua Zhou ; Liang Wang

Multilinear subspace analysis (MSA) is a promising methodology for pattern-recognition problems due to its ability in decomposing the data formed from the interaction of multiple factors. The MSA requires a large training set, which is well organized in a single tensor, which consists of data samples with all possible combinations of the contributory factors. However, such a “complete” training set is difficult (or impossible) to obtain in many real applications. The missing-value problem is therefore crucial to the practicality of the MSA but has been hardly investigated up to present. To solve the problem, this paper proposes an algorithm named M2SA, which is advantageous in real applications due to the following: 1) it inherits the ability of the MSA to decompose the interlaced semantic factors; 2) it does not depend on any assumptions on the data distribution; and 3) it can deal with a high percentage of missing values. M2SA is evaluated by face image modeling on two typical multifactorial applications, i.e., face recognition and facial age estimation. Experimental results show the effectiveness of M2 SA even when the majority of the values in the training tensor are missing.

Published in:

IEEE Transactions on Systems, Man, and Cybernetics, Part B (Cybernetics)  (Volume:41 ,  Issue: 3 )
IEEE Biometrics Compendium
IEEE RFIC Virtual Journal
IEEE RFID Virtual Journal