Cart (Loading....) | Create Account
Close category search window
 

Statistical Classification for Heterogeneous Polarimetric SAR Images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Formont, P. ; DEMR/TSI, ONERA, Palaiseau, France ; Pascal, F. ; Vasile, G. ; Ovarlez, J.
more authors

This paper presents a general approach for high- resolution polarimetric SAR data classification in heterogeneous clutter, based on a statistical test of equality of covariance matrices. The Spherically Invariant Random Vector (SIRV) model is used to describe the clutter. Several distance measures, including classical ones used in standard classification methods, can be derived from the general test. The new approach provide a threshold over which pixels are rejected from the image, meaning they are not sufficiently “close” from any existing class. A distance measure using this general approach is derived and tested on a high-resolution polarimetric data set acquired by the ONERA RAMSES system. It is compared to the results of the classical H-α decomposition and Wishart classifier under Gaussian and SIRV assumption. Results show that the new approach rejects all pixels from heterogeneous parts of the scene and classifies its Gaussian parts.

Published in:

Selected Topics in Signal Processing, IEEE Journal of  (Volume:5 ,  Issue: 3 )

Date of Publication:

June 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.