Cart (Loading....) | Create Account
Close category search window

Displacement Estimation by Maximum-Likelihood Texture Tracking

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Harant, O. ; GIPSA-Lab., CNRS, St. Martin d''Heres, France ; Bombrun, L. ; Vasile, G. ; Ferro-Famil, L.
more authors

This paper presents a novel method to estimate displacement by maximum-likelihood (ML) texture tracking. The observed polarimetric synthetic aperture radar (PolSAR) data-set is composed by two terms: the scalar texture parameter and the speckle component. Based on the Spherically Invariant Random Vectors (SIRV) theory, the ML estimator of the texture is computed. A generalization of the ML texture tracking based on the Fisher probability density function (pdf) modeling is introduced. For random variables with Fisher distributions, the ratio distribution is established. The proposed method is tested with both simulated PolSAR data and spaceborne PolSAR images provided by the TerraSAR-X (TSX) and the RADARSAT-2 (RS-2) sensors.

Published in:

Selected Topics in Signal Processing, IEEE Journal of  (Volume:5 ,  Issue: 3 )

Date of Publication:

June 2011

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.