Cart (Loading....) | Create Account
Close category search window
 

Studying the Impact of Clones on Software Defects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Selim, G.M.K. ; Queen''s Univ., Kingston, ON, Canada ; Barbour, L. ; Weiyi Shang ; Adams, B.
more authors

There are numerous studies that examine whether or not cloned code is harmful to software systems. Yet, few of them study which characteristics of cloned code in particular lead to software defects. In our work, we use survival analysis to understand the impact of clones on software defects and to determine the characteristics of cloned code that have the highest impact on software defects. Our survival models express the risk of defects in terms of basic predictors inherent to the code (e.g., LOC) and cloning predictors (e.g., number of clone siblings). We perform a case study using two clone detection tools on two large, long-lived systems using survival analysis. We determine that the defect-proneness of cloned methods is specific to the system under study and that more resources should be directed towards methods with a longer 'commit history'.

Published in:

Reverse Engineering (WCRE), 2010 17th Working Conference on

Date of Conference:

13-16 Oct. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.