Cart (Loading....) | Create Account
Close category search window
 

Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
El-Deeb, W.S. ; Dept. of Electr. & Comput. Eng., Univ. of Calgary, Calgary, AB, Canada ; Hashmi, M.S. ; Smida, S.B. ; Boulejfen, N.
more authors

A reflection-based thru-less de-embedding technique for voltage and current waveforms and absolute power flow measurements suitable for on-wafer large-signal characterisation of microwave transistors is proposed. Based on the novel calibration technique developed, which does not require any special `golden standard` for waveform calibration purposes, a comprehensive and relatively inexpensive power flow, impedance and waveform measurement system, using the microwave transition analyser as a two-channel receiver, is developed. The proposed calibration algorithm is fast, simple and accurate for power de-embedding and waveform measurements. This kind of on-wafer power de-embedding and waveform measurement is helpful in the design of switching-mode power amplifiers. The developed system was tested for both 50Ω and non-50Ω terminated passive and active devices, and the obtained results show very good agreement with those obtained with commercial instruments.

Published in:

Microwaves, Antennas & Propagation, IET  (Volume:4 ,  Issue: 11 )

Date of Publication:

November 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.