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Radiation Test of 8 Bit Microcontrollers ATmega128 & AT90CAN128

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3 Author(s)

We have performed heavy ion tests of the ATmega128 and AT90CAN128 micro controller. These COTS devices have shown a quite different sensitivity to SEL/SEU errors, where the current consumption showed a step like behaviour. Detailed measurements, analyses and on-orbit rates are presented.

Published in:

Radiation Effects Data Workshop (REDW), 2010 IEEE

Date of Conference:

20-23 July 2010