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SEE Testing of National Semiconductor's LM98640QML System on a Chip for Focal Plane Arrays and Other Imaging Systems

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5 Author(s)
Kruckmeyer, K. ; Nat. Semicond., Santa Clara, CA, USA ; Eddy, R. ; Szczapa, A. ; Brown, B.
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National Semiconductor's LM98640QML is a complex signal processing solution interface for CCDs and CMOS imagers used in focal plane arrays and other imaging systems. This complex system on a chip (SOC) consists of an integrated 14 bit analog-to-digital converter (ADC), correlated double sampler, delay-locked loop (DLL), serial interface, digital-to-analog converters (DAC), programmable variable gain amplifiers and other components. Single event effect (SEE) characterization of a complex, precision SOC with many different operating modes can present significant challenges. Heavy ion test challenges, solutions and results are presented here.

Published in:

Radiation Effects Data Workshop (REDW), 2010 IEEE

Date of Conference:

20-23 July 2010