Referenced Items are not available for this document.
A cross comparison of SEU, SEFI and SEL responses in >30 devices (SRAMs μprocessors and FPGAs) using different neutron/proton beams leads to observation that SEU and SEFI cross sections from 14 MeV neutrons are within <;2 compared to LANL neutron beam.
Published in:
Radiation Effects Data Workshop (REDW), 2010 IEEE
Date of Conference: 20-23 July 2010
- Page(s):
- 8
- ISSN :
- 2154-0519
- Print ISBN:
- 978-1-4244-8405-8
- INSPEC Accession Number:
- 11646663
- Conference Location :
- Denver, CO
- Digital Object Identifier :
- 10.1109/REDW.2010.5619496
- Product Type:
- Conference Publications
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