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90-nm Digital Single Event Transient Pulsewidth Measurements

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3 Author(s)
Reed K. Lawrence ; BAE Syst., Manassas, VA, USA ; Jason F. Ross ; Neil E. Wood

Single event transient (SET) pulsewidth measurements were made on 9SF 90 nm shift registers built with temporal delay latches on epitaxial substrates. Data was gathered using heavy ions from LETs of 9.75 to 58.78 (MeV-cm2)/mg.

Published in:

2010 IEEE Radiation Effects Data Workshop

Date of Conference:

20-23 July 2010