The authors evaluated the electron detection performance of a diamond avalanche diode (DAD) detector. In the electrode region, the gain was uniformly about 103 with little noise. Meanwhile, an avalanche multiplication occurred locally. In the avalanche region, a total gain of 5×104 was obtained. In some regions where the electric field is regarded to be intensified, the avalanche multiplication gain was estimated to be approximately 100–300, and the signal-to-noise ratio (S/N) was nearly equal to 1. The DAD can be applied to an electron detector for a scanning electron microscope due to its high gain and small dark current. However, it is necessary to improve the S/N and homogenize the gain to use the DAD detector as an electron detector.
Published in:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
(Volume:28
,
Issue:
6
)
Date of Publication:
Nov 2010
- Page(s):
-
1169
-
1172
- ISSN :
-
1071-1023
- Digital Object Identifier :
-
10.1116/1.3497031
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
25 October 2010
- Issue Date :
-
Nov 2010