By Topic

Carrier-to-envelope resonances, quasi periodicity and 1/f frequency noise in an injection-locked oscillator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Planat, M. ; Lab. de Phys. et Metrol. des Oscillateurs, CNRS, Besancon, France ; Dos Santos, S. ; Lardet-Vieudrin, F.

In our recent work (see IEEE Trans. on UFFC, vol. 43, p. 326, 1996) we reported on a new multiscale processing of the time series of frequency deviations. It allowed us to demonstrate global correlations in the time sequence and to conjecture a possible determinism behind them. In this paper we extend that work in demonstrating experimentally synchronization phenomenon concerning an electronic carrier signal and its low frequency modulations. The effect is termed carrier-to-envelope resonance since it manifests itself at subharmonics pf0/q (p and q integers, p<q) of the angular carrier frequency f0. It is obtained from an original pulse modulating technique in which the pulse duration is slaved to the carrier and the envelope frequencies. In contrast to the conventional phase locked loop scheme, the new set-up gives rise to synchronization states concerning both the amplitude and the frequency of oscillations. This is similar to the energy quantization in quantum mechanics. Thus the carrier-to-envelope frequency ratio is quantized at integer and rational numbers depending on the excitation power

Published in:

Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.

Date of Conference:

5-7 Jun 1996