By Topic

Stress sensitivity coefficients: a general approach for bulk, Rayleigh and surface transverse waves

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
E. Bigler ; CNRS, Univ. de Franche-Comte, Besancon, France ; S. Ballandras

An analytical approach of intrinsic stress sensitivity coefficients is presented. The model is first applied to investigate the sensitivity of bulk and Rayleigh wave devices to mechanical stresses. A comparison is made with Finite Element Analysis (FEA) methods and it is shown that the stress sensitivity coefficients approach can predict the existence of stress compensated crystal cuts and correctly model the force frequency effect of a circular disk with a dramatic reduction of computation time. The model is extended to the case of Surface Transverse Waves (STW) propagating on singly-rotated quartz plates. It is shown that by a highly interesting coincidence planar isotropic stress compensation occurs for STW devices now built and tested (AT-plates). The case of planar stress sensitivity of STW devices on thin plates is considered

Published in:

Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.

Date of Conference:

5-7 Jun 1996