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Growth and characterization of optical grade synthetic quartz

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3 Author(s)
Suzuki, C.K. ; Dept. of Mater. Eng., Univ. Estadual de Campinas, Sao Paulo, Brazil ; Tanaka, M.S. ; Shinohara, A.H.

A method to position the seed and Z-region of growth out of the circulating micro-particle flux in commercial autoclave has been used to grow optical grade synthetic quartz. The number of solid inclusions is in the range of 0.02-0.03 particles/cm3, depending on the bar. The observation of X-ray topographic contrast of (0003) reflection shows a much smaller Z-region lattice spacing (strain) in comparison with the seed. The dislocation lines are in their totality originated by the seed etch-channels, that means, they can be eliminated by using a better quality seed

Published in:

Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.

Date of Conference:

5-7 Jun 1996