Cart (Loading....) | Create Account
Close category search window
 

Fast wavelet-based pansharpening of multi-spectral images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mitianoudis, N. ; Sch. of Sci. & Technol., Int. Hellenic Univ., Thessaloniki, Greece ; Tzimiropoulos, G. ; Stathaki, T.

Remote Sensing systems enhance the spatial quality of low-resolution Multi-Spectral (MS) images using information from Pan-chromatic (PAN) images under the pansharpening framework. Most decimated multi-resolution pansharpening approaches upsample the low-resolution MS image to match the resolution of the PAN image. Consequently, a multi-level wavelet decomposition is performed, where the edge information from the PAN image is injected in the MS image. In this paper, the authors propose a pansharpening framework that eliminates the need of upsampling of the MS image, using a B-Spline biorthogonal wavelet decomposition scheme. The proposed method features similar performance to the state-of-the-art pansharpening methods without the extra computational cost induced by upsampling.

Published in:

Imaging Systems and Techniques (IST), 2010 IEEE International Conference on

Date of Conference:

1-2 July 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.