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The interface between different types of thick film layers

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1 Author(s)
Pelikanova, I.B. ; Dept. of Electrotechnol., CTU in Prague, Prague, Czech Republic

The investigation of conductive and resistive layers interface is topic of the work. Layers of measured structure were deposited by screen-printing of polymer pastes. The measured structure consists of contact area with different geometry. Contact resistance of interface between conductive and resistive layers was measured as a parameter of quality. The three-wire method was used for measurement. Experimental results were analyzed in the context of contacts geometry and frequency of powered signal.

Published in:

Electronics Technology (ISSE), 2010 33rd International Spring Seminar on

Date of Conference:

12-16 May 2010

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