By Topic

The interface between different types of thick film layers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Pelikanova, I.B. ; Dept. of Electrotechnol., CTU in Prague, Prague, Czech Republic

The investigation of conductive and resistive layers interface is topic of the work. Layers of measured structure were deposited by screen-printing of polymer pastes. The measured structure consists of contact area with different geometry. Contact resistance of interface between conductive and resistive layers was measured as a parameter of quality. The three-wire method was used for measurement. Experimental results were analyzed in the context of contacts geometry and frequency of powered signal.

Published in:

Electronics Technology (ISSE), 2010 33rd International Spring Seminar on

Date of Conference:

12-16 May 2010