Cart (Loading....) | Create Account
Close category search window

Fabrication of GaAs/AlGaAs based quantum resistance standards

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

This paper reports on the progress in the development of fabrication process of metrological quantum Hall effect (QHE) devices from GaAs/AlGaAs two-dimensional electron gas (2DEG), including single Hall bar quantum resistance standards, Quantum Hall Arrays Resistance Standards (QHARS) and other specific devices (quantum Wheatstone bridges) dedicated to very high-accuracy quantum Hall resistance comparisons and QHE universality tests. Single Hall bars have been obtained exhibiting very low resistance ohmic contacts (<;0.3 Ω), low longitudinal resistances (<;10 μΩ), bearing high biasing currents (up to 250 μA), hence allowing the Hall resistance to be measured exactly quantized on the V = 2 plateau at the expected value within an uncertainty lower than 2 parts in 109. Besides, crucial steps have been overcome in the sophisticated fabrication process of QHARS.

Published in:

Precision Electromagnetic Measurements (CPEM), 2010 Conference on

Date of Conference:

13-18 June 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.