IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Precision Electromagnetic Mea ... Help

Estimating measurement uncertainties

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Francis, M.H. ; National Institute of Standards and Technology, USA

Summary form only given: This tutorial will describe some general methods of estimating measurement uncertainties. These include estimates based on theory, simulation, and altering the measurement system. Combining uncertainties will be discussed. The conditions for the validity of the central limit theorem will be considered. Finally, a measurement example from planar near-field measurements will be given.

Published in:
Precision Electromagnetic Measurements (CPEM), 2010 Conference on

Date of Conference: 13-18 June 2010

Page(s):
369
Print ISBN:
978-1-4244-6795-2
INSPEC Accession Number:
11466438
Conference Location :
Daejeon
Digital Object Identifier :
10.1109/CPEM.2010.5543457
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.