Cart (Loading....) | Create Account
Close category search window
 

Thermal analysis of 8-T SRAM for nano-scaled technologies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Meterelliyoz, M. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Kulkarni, J.P. ; Roy, K.

Different sections of a cache memory may experience different temperature profiles depending on their proximity to other active logic units such as the execution unit. In this paper, we perform thermal analysis of cache memories under the influence of hot-spots. In particular, 8-T SRAM bit cell is chosen because of its robust functionality at nano-scaled technologies. Thermal map of entire 8-T SRAM cache is generated using hierarchical compact thermal models while solving the leakage and temperature self consistently. The impact of spatial temperature variations on 8T-SRAM parameters such as local bitline (LBL) sensing delay, noise robustness and bitcell stability are evaluated for 45nm/32nm/22nm bulk CMOS technology nodes. The effectiveness of variable keeper sizing on LBL sensing delay is analyzed. It is predicted that at 22 nm node, the leakage induced temperature rise has severe effects on the 8-T SRAM characteristics.

Published in:

Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on

Date of Conference:

11-13 Aug. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.