Cart (Loading....) | Create Account
Close category search window

Residue growth on metallic-hard mask after dielectric etching in fluorocarbon-based plasmas. I. Mechanisms

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Posseme, N. ; CEA/LETI-Minatec, 17 rue des Martyrs, 38054 Grenoble Cedex 09, France ; Chevolleau, T. ; Bouyssou, R. ; David, T.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

This work focuses on the formation of residues that grow on a metallic-hard mask after etching of porous low-k materials in fluorocarbon-based plasmas. The residue growth, which is dependent on the air exposure time after etching, causes line and via opens that strongly impact the yield performance. The different elements which could play a role in the chemical reactions have been clarified. The authors have demonstrated that in their experimental conditions, after fluorocarbon etching and air exposure, the oxidized titanium nitride reacts with fluorhydric acid to form metallic salts. This is a reaction between fluorine from the reactive layer formed on titanium nitride and hydrogen coming from the atmosphere. This reaction is all the more fast because the titanium nitride is oxidized.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:28 ,  Issue: 4 )

Date of Publication:

Jul 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.