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State-of-art, challenges and future directions in large signal measurements for active device modeling

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1 Author(s)
D. Schreurs ; K.U.Leuven, Belgium

Vector non-linear measurements emerged two decades ago, initiating a vast range of novel applications in microwave characterisation, modeling, and design. This paper focuses on its impact on microwave active device modeling. After sketching the evolution in instrumentation, the present capabilities are described. Today's developments are happening swiftly and on a large scale. As communication becomes more low-power, more wireless, and more bandwidth demanding, requirements for device models have evolved as well. In this paper, the present challenges in modeling and thus directions in instrumentation development are discussed.

Published in:

Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International

Date of Conference:

23-28 May 2010