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Summary form only given. One of the driving forces behind the semiconductor industry has been Moore's law. In abstract Moore's law says the number of transistors per square inch on integrated circuits will double every 18 months. Doubling transistor count in rough approximation doubles complexity. To keep the same cost, yield at the new process node must be similar to the previous node. Further, to maintain the cost of test as a percentage of AUC, then test time per transistor or cost of test per second have to be reduced by 50% in the same time lines. The research and development driven in yield management, tester development, test development and DFT have allowed an ongoing cost profile that allows for economic profile required to sustain semiconductor expansion. This talk will explore both historical and real time issues related to complexity and the test industry.
Test Symposium (ETS), 2010 15th IEEE European
Date of Conference: 24-28 May 2010