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Full-circuit SPICE simulation based validation of dynamic delay estimation

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5 Author(s)
Ke Peng ; ECE Department, University of Connecticut, Storrs, CT, USA ; Yu Huang ; Pinki Mallick ; Wu-Tung Cheng
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Power supply noise may have big impacts on the design performance in the latest technologies. Accurately mapping the IR-drop effect to real delay is a challenging task, which will directly impact the accuracy of IR-drop related performance evaluation, test, and diagnosis. In this paper, we first present our previous work on setting up an IR2Delay database for addressing this issue. We then propose a flow to validate this database by comparing it with full-circuit SPICE simulation results. In this flow, mixed-signal simulation is used, which can reuse the existing digital testbench as stimuli while maintaining the accuracy of SPICE simulation.

Published in:

2010 15th IEEE European Test Symposium

Date of Conference:

24-28 May 2010