Cart (Loading....) | Create Account
Close category search window
 

Design and Characterization of a Multilevel DRAM

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Koob, J.C. ; Dept. of Electr. & Comput. Eng., Univ. of Alberta in Edmonton, Edmonton, AB, Canada ; Ung, S.A. ; Cockburn, B.F. ; Elliott, D.G.

Multilevel DRAM (MLDRAM) increases the storage density of DRAMs by using more than two signal levels in the data storage cells. Our MLDRAM uses reference and data cell signals that are generated in the cell array using charge sharing. The single-step sensing method uses multiple reference signals in parallel. We describe an operational 19200-cell MLDRAM test chip in 1.8-V, 180-nm mixed-signal CMOS that allows 1, 1.5, 2, 2.25, and 2.5 bits-per-cell operation using 2, 3, 4, 5, and 6 data signal levels, respectively. Characterization features include a partitioned memory array with four different data cell sizes, two sense amplifier sizes, and selective bitline shielding. New tests were developed using an MLDRAM fault model covering basic functionality, retention time, multilevel march, inter-bitline coupling and cell plate voltage bump tests. We show that, with short bitlines, MLDRAM's noise margins can be similar to DRAM's to more reliably store two bits in a 1T1C cell.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:19 ,  Issue: 9 )

Date of Publication:

Sept. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.