In the above titled paper (ibid., vol. 10, no. 1, pp. 142-148, Mar. 10), corrections need to be made to Fig. 7(b). These are presented here. The change does not affect the results described in the paper.
Published in:
Device and Materials Reliability, IEEE Transactions on
(Volume:10
,
Issue:
2
)
Date of Publication: June 2010