Cart (Loading....) | Create Account
Close category search window
 

Faster Bayesian context inference by using dynamic value ranges

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Frank, K. ; Inst. of Commun. & Navig., German Aerosp. Center (DLR), Oberpfaffenhofen, Germany ; Robertson, P. ; Rodriguez, S.F. ; Moreno, R.B.

This paper shows how to reduce evaluation time for context inference. Probabilistic Context Inference has proven to be a good representation of the physical reality with uncertain or missing information, giving with the probability also a measure of the quality of information. As the inference complexity is very high, the complexity of the to be evaluated rule (representing a share of the real world) should be reduced as far as possible. Therefore we present an approach to select only relevant values of context types and to adapt this selection during its usage time. A short proof of concept indicates that both targets, reducing inference time and maintaining quality of information, can be reached with the proposed approach.

Published in:

Pervasive Computing and Communications Workshops (PERCOM Workshops), 2010 8th IEEE International Conference on

Date of Conference:

March 29 2010-April 2 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.