By Topic

Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary Characteristics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Xiaochun Yu ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Blanton, R.D.

This paper describes a multiple-defect diagnosis methodology that is flexible in handling various defect behaviors and arbitrary failing pattern characteristics. Unlike some other approaches, the search space of the diagnosis method does not grow exponentially with the number of defects. Results from extensive simulation experiments and real failing integrated circuits show that this method can effectively diagnose circuits that are affected by a large (>20) or small number of defects of various types. Moreover, this method is capable of accurately estimating the number of defective sites in the failing circuit.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:29 ,  Issue: 6 )