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An on-site calibration technique for line structured light 3D scanner

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2 Author(s)
Min Zhang ; Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China ; Dehua Li

We analyze the measuring principle and propose a calibration technique based on perpendicular cross-lines for line structured light 3D scanner. By use of straight line features and perpendicular constraints of the cross-lines, the technique doesn't require the world coordinates of those feature points on calibration template. The turntable of the 3D scanner rotates with the calibration template. We can takes a number of images of the calibration template from different arbitrary angles. And the intrinsic parameters of the camera can be obtained and further the projection plane parameters can be obtained. Experiments show that the technique has higher accuracy and better robustness. The technique is easy, quick, suited for on-site calibration.

Published in:

Computational Intelligence and Industrial Applications, 2009. PACIIA 2009. Asia-Pacific Conference on  (Volume:2 )

Date of Conference:

28-29 Nov. 2009