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A maximum-likelihood detection scheme for rapid imaging of string-like samples in atomic force microscopy

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2 Author(s)
Peter I. Chang ; Mechanical Engineering, l Boston University, MA 02215, USA ; Sean B. Andersson

In this paper, we present a sample-detection scheme designed for non-raster scanning in atomic force microscopy. The scheme utilizes a maximum-likelihood estimator applied over a moving window and enables the tracking of a string-like sample. By tracking, the tip is kept in proximity to the sample, reducing the total imaging time by eliminating the measurement of unnecessary information. We combine the new estimator with previously reported results and apply the algorithm in simulation to actual data obtained through a raster-scan image of DNA.

Published in:

Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on

Date of Conference:

15-18 Dec. 2009