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A fast image reconstruction algorithm using significant sample point selection and linear bivariate splines

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4 Author(s)
Rohit Verma ; Under-graduate student of Computer Science at Jaypee University of Information Technology, Solan, India ; Ruchika Mahrishi ; Gaurav Kumar Srivastava ; Siddavatam Rajesh

The image reconstruction using linear bivariate splines and Delaunay triangulation is addressed in this paper. A novel significant sample point selection is used to get the most significant samples for triangulation. Image reconstruction is done based on the approximation of image regarded as a function, by a linear spline over adapted Delaunay triangulation. The proposed method is compared with some of the existing image reconstruction spline models.

Published in:

TENCON 2009 - 2009 IEEE Region 10 Conference

Date of Conference:

23-26 Jan. 2009