A fast image reconstruction algorithm using significant sample point selection and linear bivariate splines

The image reconstruction using linear bivariate splines and Delaunay triangulation is addressed in this paper. A novel significant sample point selection is used to get the most significant samples for triangulation. Image reconstruction is done based on the approximation of image regarded as a function, by a linear spline over adapted Delaunay triangulation. The proposed method is compared with some of the existing image reconstruction spline models.